By Bharat Bhushan, Harald Fuchs
From the reviews:
"Vol. XI includes contributions approximately contemporary advancements in scanning probe microscopy thoughts. … The editors and their proficient authors were one of the leaders within the research of probe equipment. … each one bankruptcy captures either the thrill and the significance of the paintings and conclusions mentioned, and may make ecocnomic analyzing for researchers in any respect adventure degrees. … all of the chapters are supported by means of huge lists of references and fantastically illustrated and in colour too, additionally in addition to graphs, equations etc." (Current Engineering perform, 2009)
“The articles … are written in adequate aspect, in order that collage scholars, researchers and engineers can comprehend the physics of the tools, the layout and development of the units and the cantilevers, the sign processing algorithms, and their use in imaging and the outside characterization of the specimens. … SPM encompasses a number of suggestions, together with scanning near-field optical microscopy, which has attention-grabbing functions … . well-written and obviously illustrated. … comprise abundant experimental information and demanding dialogue of barriers and artifacts.” (Barry R. Masters, Optics & Photonics information, September, 2009)
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Additional info for Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques
Example text
105 Applications of Scanning Probe Methods in Chemical Mechanical Planarization Toshi Kasai, Bharat Bhushan . . . . . . . . . . . 131 Scanning Probe Microscope Application for Single Molecules in a π -Conjugated Polymer Toward Molecular Devices Based on Polymer Chemistry Ken-ichi Shinohara . . . . . . . . . . . . . 153 Scanning Probe Microscopy on Polymer Solar Cells Joachim Loos, Alexander Alexeev . . . . . . . . . 183 Scanning Probe Anodization for Nanopatterning Hiroyuki Sugimura .
65 14 Single-Molecule Studies on Cells and Membranes Using the Atomic Force Microscope Ferry Kienberger, Lilia A. Chtcheglova, Andreas Ebner, Theeraporn Puntheeranurak, Hermann J. Gruber, Peter Hinterdorfer . . . . . . . . . . . . . . 101 15 Atomic Force Microscopy of DNA Structure and Interactions Neil H. Thomson . . . . . . . . . . . . . . 127 Direct Detection of Ligand–Protein Interaction Using AFM Małgorzata Lekka, Piotr Laidler, Andrzej J. Kulik .
347 Automated AFM as an Industrial Process Metrology Tool for Nanoelectronic Manufacturing Tianming Bao, David Fong, Sean Hand . . . . . . . . it. M. es XLVI List of Contributors – Volume XI Dmytro S. de Mykhaylo Evstigneev Fakult¨at f¨ur Physik, Universit¨at Bielefeld, Universit¨atsstr. De Harald Fuchs Physikalisches Institut and Center for Nanotechnology (CeNTech), Universit¨at M¨unster, Wilhelm-Klemm-Str. de Donna C. gov Johann Jersch Physikalisches Institut, Universit¨at M¨unster, Wilhelm-Klemm-Str.