By J. I. Langford (auth.), Professor Dr. Ir. Eric J. Mittemeijer, Professor Dr. Paolo Scardi (eds.)
Diffraction research of the Microstructure of Materials offers an outline of diffraction tools utilized to the research of the microstructure of fabrics. in view that crystallite measurement and the presence of lattice defects have a decisive impact at the homes of many engineering fabrics, information regarding this microstructure is of important value in constructing and assessing fabrics for functional functions. the main robust and typically non-destructive review recommendations to be had are X-ray and neutron diffraction. The booklet info, between different issues, diffraction-line broadening equipment for deciding on crystallite measurement and atomic-scale pressure due, e.g. to dislocations, and techniques for the research of residual (macroscale) tension. The ebook assumes just a easy wisdom of solid-state physics and provides readers adequate info to use the tools themselves.
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Extra resources for Diffraction Analysis of the Microstructure of Materials
At high 2() angles (2() > 100 0 ) , the profile conforms primarily to the shape of the emission profile. With the exception 2 Convolution Based Profile Fitting 33 of the aberrations associated with the receiving optics and the finite X-ray source width (laboratory diffractometers), all geometrie instrument aberration profiles vary with 2e. In the following sections the shapes of the major instrument aberrations used in FPA to describe the various diffractometer configurations are briefly discussed for conditions that are typical of those encountered in practice.
Phys. 52, 748 (1981) R. H. J. Mittemeijer, in Accuracy in Powder Diffraction. Ed. by S. R. Hubbard. NBS Spec. Pub. No. 567 (US Dept of Commerce, Gaithersburg 1980) pp. 231-253 J. Mignot and D. Rondot: Acta Metall. 23, 1321 (1975) J. Mignot and D. Rondot: Acta Cryst. A 33, 327 (1977) R. H. J. Mittemeijer: Fresenius Z. Anal. Chem. H. J. C. Rozendaal: J. Appl. Cryst. I. Langford: J. Appl. Cryst. A. Butler, KW. E. Buchanan: Rev. Sci. lnstrum. M. G. Veeraraghavan, H. G. Winchell: J. Appl. Cryst. 10, 66 (1977) 1 Line Profile Analysis 13 46.
A furt her drawback is that the instrument function needs re-determination when relevant instrument settings, such as slit settings, change. In addition the effects of sam pie penetration by the incident beam is often overlooked resulting in increased broadening in the instrument function. This is an intrinsic error to the conventional convolution approach whereby the instrument function is linked to sampie preparation (packing density). 2 Numerical Procedures of Convolution Based Profile Fitting Convolution based profile fitting requires accurate numerical procedures for carrying out multiple convolution integrals.