By Bharat Bhushan, Harald Fuchs
The volumes XI, XII and XIII learn the actual and technical beginning for fresh growth in utilized scanning probe concepts. the 1st quantity got here out in January 2004, the second one to fourth volumes in early 2006 and the 5th to 7th volumes in past due 2006. the sector is progressing so quickly that there's a desire for a suite of volumes each 12 to 18 months to catch most up-to-date advancements. those volumes represent a well timed complete evaluate of SPM functions. After introducing scanning probe microscopy, together with sensor know-how and tip characterization, chapters on use in quite a few commercial purposes are offered. commercial purposes span topographic and dynamical floor reports of thin-film semiconductors, polymers, paper, ceramics, and magnetic and organic fabrics. The chapters were written through best researchers and alertness scientists from worldwide and from quite a few industries to supply a broader standpoint.
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Extra info for Applied Scanning Probe Methods XIII: Biomimetics and Industrial Applications (NanoScience and Technology) (No. XIII)
Jarvis, John E. Sader, Takeshi Fukuma . . . . . 315 XL Contents – Volume VIII 10 Kelvin Probe Force Microscopy: Recent Advances and Applications Yossi Rosenwaks, Oren Tal, Shimon Saraf, Alex Schwarzman, Eli Lepkifker, Amir Boag . . . . . . . . . . . . 351 11 Application of Scanning Capacitance Microscopy to Analysis at the Nanoscale Štefan Lányi . . . . . . . . . . . . . . . 12 377 Probing Electrical Transport Properties at the Nanoscale by Current-Sensing Atomic Force Microscopy Laura Fumagalli, Ignacio Casuso, Giorgio Ferrari, Gabriel Gomila .
23 Low-Noise Methods for Optical Measurements of Cantilever Deflections Tilman E. Schäffer . . . . . . . . . . . . . . 51 Q-controlled Dynamic Force Microscopy in Air and Liquids Hendrik H¨olscher, Daniel Ebeling, Udo D. Schwarz . . . . 75 High-Frequency Dynamic Force Microscopy Hideki Kawakatsu . . . . . . . . . . . . . . 99 Torsional Resonance Microscopy and Its Applications Chanmin Su, Lin Huang, Craig B. Prater, Bharat Bhushan . . . 113 Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy Yaxin Song, Bharat Bhushan .
H. Kim . . . . 77 Nanoelectromechanical Systems – Experiments and Modeling Horacio D. Espinosa, Changhong Ke . . . . . . . . 135 Application of Atom-resolved Scanning Tunneling Microscopy in Catalysis Research Jeppe Vang Lauritsen, Ronny T. Vang, Flemming Besenbacher . . 197 26 Nanostructuration and Nanoimaging of Biomolecules for Biosensors Claude Martelet, Nicole Jaffrezic-Renault, Yanxia Hou, Abdelhamid Errachid, François Bessueille . . . . . . . 225 27 Applications of Scanning Electrochemical Microscopy (SECM) Gunther Wittstock, Malte Burchardt, Sascha E.